The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jan. 11, 2021
Applicant:

Star Technologies, Inc., Hsinchu, TW;

Inventors:

Choon Leong Lou, Hsinchu, TW;

Chen-Wen Pan, Hsinchu, TW;

Jung-Chieh Liu, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2874 (2013.01); H01L 21/67109 (2013.01); H01L 21/67248 (2013.01);
Abstract

The present disclosure provides a probing apparatus for semiconductor devices using pressurized fluid to control the testing conditions. The probing apparatus includes a housing configured to define a testing chamber; a device holder positioned on the housing and configured to hold and support at least one device under test; a platen positioned on the housing and configured to retain at least one probe; a card holder positioned on the platen and configured to hold a probe card including the probe; and at least one flow line positioned in the card holder. The flow line is configured to flow a fluid therein to adjust the temperature of the device under test.


Find Patent Forward Citations

Lou, Choon. (2023). Probing apparatus with temperature-adjusting mechanism (U.S. Patent No. 11754619). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11754619

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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