For the Inventor, By the Inventor

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Gyeongsangbuk-Do, South Korea

Sk Siltron Co., Ltd.

USPTO Granted Patents = 4

Forward Citations = 0

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8 inventors (with patents filed for the assignee):

Kee Yun Han (1 out of 5 patents)

Woo Young Park (1 out of 2 patents)

Se Ah Oh (1 out of 1 patent)

4. Je Hyung Seo (1 out of 1 patent)

5. Jung Won Shin (1 out of 1 patent)

6. Ho Yong Lee (1 out of 1 patent)

7. Jae Min Seok (1 out of 1 patent)

8. Sung Ho Kim (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 12660548 - ASC process automation device (2026-06-16),

2. 12596078 - Apparatus for analyzing metal contamination of a wafer and a method thereof (2026-04-07),

3. 12536642 - Device for evaluating edge defects in a silicon wafer and method therof (2026-01-27),

4. 12533873 - Device and method for separating wafers (2026-01-27),

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USPTO Data Jan 1 1976 - Sep 29 2026

4 Patents

#406 in Gyeongsangbuk-Do

#2,187 in South Korea

Gyeongsangbuk-Do, South Korea

Sk Siltron Co., Ltd.

Forward Citations = 0

8 inventors:

Kee Yun Han (1 out of 5 patents)

Woo Young Park (1 out of 2 patents)

Se Ah Oh (1 out of 1 patent)

4. Je Hyung Seo (1 out of 1 patent)

5. Jung Won Shin (1 out of 1 patent)

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