Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
13 Patents
#355 in San Francisco, CA
#5,661 in California
#23,854 in US
#45,081 in the World
Sight Machine, Inc.
Forward Citations = 32
4 inventors:
San Francisco, CA, United States of America
Sight Machine, Inc.
EPO Patents = 4
Forward Citations = 32
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4 inventors (with patents filed for the assignee):
Nathan Oostendorp (13 out of 13 patents)
Kurtis Alan Demaagd (11 out of 11 patents)
Ryan L Smith (7 out of 32 patents)
4. Anthony Michael Oliver (4 out of 4 patents)
5. Ryan Smith (0 patent)
6. Alan Kurtis Demaagd (0 patent)
13 patents:
2. 12368824 - Machine-vision system and method for remote quality inspection of a product (2025-07-22),
5. 11722642 - Machine-vision system and method for remote quality inspection of a product (2023-08-08),
7. 11102455 - Machine-vision system and method for remote quality inspection of a product (2021-08-24),
11. 10134122 - System and method of distributed processing for machine-vision analysis (2018-11-20),
Company Overview
Sight Machine, Inc. is a technology company based in San Francisco, specializing in advanced manufacturing analytics. The organization focuses on leveraging artificial intelligence and machine learning to transform data from manufacturing processes into actionable insights. By integrating cloud-based solutions, Sight Machine enables manufacturers to optimize operations, enhance productivity, and improve quality control. Their innovative approach aims to drive digital transformation within the manufacturing sector, making it more efficient and responsive to market demands.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sight Machine, Inc.. Retrieved from https://idiyas.com/company/sight-machine
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
4 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]