The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Jul. 19, 2023
Applicant:

Sight Machine, Inc., San Francisco, CA (US);

Inventors:

Nathan Oostendorp, Ann Arbor, MI (US);

Kurtis Alan Demaagd, Grand Ledge, MI (US);

Anthony Michael Oliver, Manchester, MI (US);

Assignee:

Sight Machine, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 7/181 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.


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