The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

May. 14, 2021
Applicant:

Sight Machine, Inc., San Francisco, CA (US);

Inventors:

Nathan Oostendorp, Ann Arbor, MI (US);

Kurtis Alan Demaagd, Chelsea, MI (US);

Ryan Smith, San Francisco, CA (US);

Assignee:

Sight Machine, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/418 (2006.01); G06F 16/951 (2019.01); G06Q 10/0639 (2023.01); G06Q 50/04 (2012.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0272 (2013.01); G05B 19/41875 (2013.01); G05B 23/0235 (2013.01); G06Q 10/06395 (2013.01); G06Q 50/04 (2013.01); G08B 21/182 (2013.01); G05B 2219/32191 (2013.01); G06F 16/951 (2019.01); Y02P 90/80 (2015.11);
Abstract

A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.


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