San Francisco, CA, United States of America

Sift Science, Inc.


USPTO Granted Patents = 43

Forward Citations = 319

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56 inventors (with patents filed for the assignee):

goldMedal Fred Sadaghiani (19 out of 19 patents)

silverMedal Wei Liu (17 out of 18 patents)

bronzeMedal Jacob Burnim (12 out of 12 patents)

4.  Alex Paino (12 out of 12 patents)

5.  Keren Gu (11 out of 11 patents)

6.  Noah Grant (8 out of 8 patents)

7.  Eugenia Ho (7 out of 7 patents)

8.  Hui Wang (6 out of 6 patents)

9.  Pradhan Bagur Umesh (5 out of 5 patents)

10.  Rishabh Kothari (4 out of 5 patents)

11.  Kostyantyn Gurnov (4 out of 5 patents)

12.  Vera Dadok (4 out of 4 patents)

13.  Yuan Zhuang (4 out of 4 patents)

14.  Irving Chen (4 out of 4 patents)

15.  Gary Lee (4 out of 5 patents)


Core Competencies:
Digital Threat Assessment
Machine Learning
Fraud Detection
Automated Decisioning
Anomaly Detection
Content Clustering
Threat Scoring
Data Labeling
User Threat Detection
Automated Workflows
Probationary Workflows
Malicious Account Testing

43 patents:

Company Overview
Sift Science, Inc., based in San Francisco, CA, specializes in digital threat mitigation through advanced machine learning technologies. The company focuses on fraud detection and automated decisioning, providing solutions that enhance security and streamline operations for businesses. Their expertise extends to anomaly detection and content threat detection, enabling organizations to identify and respond to potential risks effectively. Sift's innovative approach includes automated labeling and probationary workflows, ensuring a robust defense against evolving digital threats.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Sift Science, Inc. USPTO Patent Assignee Logo
43 Patents

#106 in San Francisco, CA

#1,901 in California

#8,104 in US

#16,047 in the World

San Francisco, CA (US)
San Francisco, CA, United States of America
Forward Citations = 319

56 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sift Science, Inc.. Retrieved from https://idiyas.com/company/sift-science

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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