The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Mar. 14, 2022
Applicant:

Sift Science, Inc., San Francisco, CA (US);

Inventors:

Wei Liu, Seattle, WA (US);

Ralf Gunter Correa Carvalho, Seattle, WA (US);

Assignee:

Sift Science, Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06N 5/022 (2013.01); G06F 2221/034 (2013.01);
Abstract

A system and method for accelerating an automated labeling of a volume of unlabeled digital event data samples includes identifying a corpus characteristic of a digital event data corpus that includes a plurality of distinct unlabeled digital event data samples; selecting an automated bulk labeling algorithm based on the corpus characteristic associated with the digital event data corpus satisfying a bulk labeling criterion of the automated bulk labeling algorithm; evaluating a subset of the plurality of unlabeled digital event data samples, wherein evaluating the subset includes attributing a distinct classification label to each digital event data sample within the subset; and in response to the selection, executing the selected automated bulk labeling algorithm against the digital event data corpus, wherein the executing includes simultaneously assigning a classification label equivalent to the distinct classification label to a superset of the digital event data corpus that relates to the subset.


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