The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Jun. 10, 2022
Applicant:

Sift Science, Inc., San Francisco, CA (US);

Inventors:

Chang Liu, Seattle, WA (US);

Helen Marushchenko, San Francisco, CA (US);

Wei Liu, San Francisco, CA (US);

Assignee:

Sift Science, Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06N 5/022 (2013.01); H04L 63/1416 (2013.01);
Abstract

A system and method for adaptively sampling a corpus of data samples for improving an accuracy of a predictive machine learning model includes: identifying the corpus of data samples, wherein each data sample of the corpus of data samples is associated with a machine learning-derived threat inference value; stratifying the corpus of data samples into a plurality of distinct strata based on the machine learning-derived threat inference value associated with each data sample of the corpus of data samples; adaptively sampling the plurality of distinct strata; constructing a machine learning training corpus comprising a plurality of data samples based on the adaptive sampling of the plurality of distinct strata; and training the predictive machine learning model based on the machine learning training corpus.


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