Forward Citations = 157

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3 inventors (with patents filed for the assignee):

Nagaraja P Rao (2 out of 2 patents)

Patrick D Kinney (2 out of 25 patents)

Anand Gupta (1 out of 44 patents)

2 patents: Sort by Forward Citations

1. 6809809 - Optical method and apparatus for inspecting large area planar objects (2004-10-26),

2. 6630996 - Optical method and apparatus for inspecting large area planar objects (2003-10-07),

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

2 Patents

#7 in Castro Valley, CA

#21,008 in California

#94,841 in US

Castro Valley, CA, United States of America

Real Time Metrology, Inc.

Forward Citations = 157

3 inventors:

Nagaraja P Rao (2 out of 2 patents)

Patrick D Kinney (2 out of 25 patents)

Anand Gupta (1 out of 44 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Real Time Metrology, Inc.. Retrieved from https://idiyas.com/company/real-time-metrology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]