Nagaraja P Rao

Title: Innovations by Nagaraja P Rao

Introduction

Nagaraja P Rao is a notable inventor based in San Carlos, CA (US). He has made significant contributions to the field of optical inspection technology. With a total of 2 patents, his work focuses on enhancing the methods used for inspecting large area planar objects.

Latest Patents

Nagaraja P Rao's latest patents include an optical method and apparatus for inspecting large area planar objects. This invention provides an optical inspection module designed to detect defects on substrates with opposite planar surfaces. The module features a substrate holding position and two measurement instruments. The first instrument utilizes a grazing angle of incidence to illuminate the first surface, while a photodetector collects non-specularly reflected light. The second instrument is oriented to sense physical characteristics of the second surface during the inspection process. Another patent focuses on detecting particles on a substrate surface, employing a light source and a photodetector array to cover the entire surface area.

Career Highlights

Nagaraja P Rao is currently associated with Real Time Metrology, Inc., where he applies his expertise in optical inspection technologies. His innovative approaches have contributed to advancements in the field, making significant impacts on quality control processes.

Collaborations

Throughout his career, Nagaraja has collaborated with notable professionals such as Patrick D Kinney and Anand Gupta. These collaborations have fostered a productive environment for innovation and development in optical inspection technologies.

Conclusion

Nagaraja P Rao's contributions to optical inspection technology through his patents and collaborations highlight his role as a significant inventor in the field. His work continues to influence advancements in quality control and inspection methodologies.