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Santa Clara, CA, United States of America

Prometrix Corporation

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USPTO Granted Patents = 19

Trademarks = 2

Forward Citations = 1,437

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21 inventors (with patents filed for the assignee):

Chester L Mallory (13 out of 17 patents)

David S Perloff (9 out of 9 patents)

Leslie A Lane (7 out of 7 patents)

4. Lynn V Lybeck (6 out of 6 patents)

5. Hung V Pham (3 out of 5 patents)

6. Wayne K Borglum (3 out of 3 patents)

7. Shoji Kumagi (2 out of 2 patents)

8. Timothy R Corle (2 out of 2 patents)

9. Younus Vora (1 out of 5 patents)

10. Barry G Broome (1 out of 35 patents)

11. Adam Eales Norton (1 out of 51 patents)

12. Phillip D Wasserman (1 out of 1 patent)

13. Philip D Wasserman (1 out of 7 patents)

14. Edric H Tong (1 out of 1 patent)

15. Walter H Johnson (1 out of 3 patents)

19 patents: Sort by Forward Citations

1. D434202 - Coin redemption apparatus (2000-11-21),

2. D432159 - Coin counting and sorting apparatus (2000-10-17),

3. 5486701 - Method and apparatus for measuring reflectance in two wavelength bands (1996-01-23),

4. 5386317 - Method and apparatus for imaging dense linewidth features using an (1995-01-31),

5. 5260668 - Semiconductor surface resistivity probe with semiconductor temperature (1993-11-09),

6. 5226118 - Data analysis system and method for industrial process control systems (1993-07-06),

7. 5067805 - Confocal scanning optical microscope (1991-11-26),

8. 4967381 - Process control interface system for managing measurement data (1990-10-30),

9. 4951190 - Multilevel menu and hierarchy for selecting items and performing tasks (1990-08-21),

10. 4945220 - Autofocusing system for microscope having contrast detection means (1990-07-31),

11. 4907931 - Apparatus for handling semiconductor wafers (1990-03-13),

12. 4873623 - Process control interface with simultaneously displayed three level (1989-10-10),

13. 4843538 - Multi-level dynamic menu which suppresses display of items previously (1989-06-27),

14. 4805089 - Process control interface system for managing measurement data (1989-02-14),

15. 4776695 - High accuracy film thickness measurement system (1988-10-11),

Company Overview

Prometrix Corporation, based in Santa Clara, California, specializes in advanced semiconductor manufacturing solutions. The company focuses on developing innovative metrology and inspection technologies that enhance the production processes of integrated circuits. Prometrix's expertise lies in providing high-precision measurement systems that support the semiconductor industry's evolving needs, ensuring quality and efficiency in manufacturing. Their commitment to research and development positions them at the forefront of technology in the semiconductor domain.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 10 2026

19 Patents

#174 in Santa Clara, CA

#4,115 in California

#17,176 in US

#32,767 in the World

Santa Clara, CA, United States of America

Prometrix Corporation

Forward Citations = 1,437

21 inventors:

Chester L Mallory (13 out of 17 patents)

David S Perloff (9 out of 9 patents)

Leslie A Lane (7 out of 7 patents)

4. Lynn V Lybeck (6 out of 6 patents)

5. Hung V Pham (3 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Prometrix Corporation. Retrieved from https://idiyas.com/company/prometrix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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