The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 1989
Filed:
May. 15, 1987
Leslie A Lane, Santa Clara, CA (US);
Lynn V Lybeck, Moss Beach, CA (US);
David S Perloff, Sunnyvale, CA (US);
Shoji Kumagi, Santa Clara, CA (US);
Prometrix Corporation, Santa Clara, CA (US);
Abstract
A system and method for computer control of machine processes. The operator of the system selects and specifies process control parameters through the use of a three level dynamic menu. The first level of the menu is used to select a group of process parameters. The second and third menus together have the visual appearance of a set of index cards, the second menu forming tabs on the index cards, and the third menu comprising the set of process parameters listed on each index card. Each process parameter has a preassigned entry status: operator unalterable, operator alterable, forced operator entry, or single time forced entry (value must be entered only once when the process is run several times). The selected process cannot be run until values have been entered for all parameters having an entry status of forced operator entry or single time forced entry. Edit field parameters limit the operator's options to a predefined set of parameter values. Edit field parameters are also used to specify complicated parameter values having a multiplicity of subparameter values. The defination of each process can include a measurement data structure which defines measurement data to be collected during the running of the process. The measurement data to be collected is specified by specifying a set of data analysis tasks, and specifying the measurement data needed for each data analysis task. The measurement data structure includes definitions of the specified data analysis tasks and the measurements to be collected.