For the Inventor, By the Inventor

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Santa Clara, CA, United States of America

Picarro, Inc.

USPTO Granted Patents = 79

% Expired Patents = 12.7

EPO Patents = 3

Trademarks = 1

Forward Citations = 836

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60 inventors (with patents filed for the assignee):

Chris W Rella (52 out of 52 patents)

Sze Meng Tan (44 out of 44 patents)

Eric R Crosson (18 out of 23 patents)

4. David Steele (14 out of 14 patents)

5. Bruce A Richman (11 out of 14 patents)

6. Barbara A Paldus (10 out of 20 patents)

7. Yonggang He (8 out of 8 patents)

8. John Allen Hoffnagle (8 out of 19 patents)

9. Serguei Koulikov (6 out of 37 patents)

10. Sean Patrick MacMullin (6 out of 6 patents)

11. Michael R Woelk (6 out of 6 patents)

12. Aaron Van Pelt (5 out of 5 patents)

13. Alexander Katchanov (5 out of 5 patents)

14. Jinchun Xie (5 out of 5 patents)

15. Alejandro Dario Farinas (4 out of 11 patents)

Core Competencies:

Gas Leak Detection

Cavity Enhanced Absorption Spectroscopy

Multi-Channel Sampling

Emission Quantification

Spectroscopic Analysis

Leak Detection Systems

Gas Detection Methods

Spatial Concentration Variability

Isotope Ratio Measurements

Survey Area Indicators

Optical Spectroscopy

Mobile Survey Equipment

79 patents: Sort by Forward Citations

1. 12693213 - Per-frequency correction of spectroscopic interference (2026-07-28),

2. 12644874 - Methane emission assessment using mobile surveys over time in a target area (2026-06-02),

3. 12416553 - Thermal desorption preconcentrator adapted for spectroscopic gas analysis (2025-09-16),

4. 12320791 - Creating mass flow parity in a variant multi-channel sampling system (2025-06-03),

5. 12270706 - Cavity enhanced absorption spectroscopy using a piecewise tunable laser and hierarchical wavelength determination (2025-04-08),

6. 12235190 - Gas detection systems and methods using survey area indicators (2025-02-25),

7. 11933774 - Leak detection event aggregation and ranking systems and methods (2024-03-19),

8. 11592388 - Clutter avoidance in wide-band cavity ring-down data acquisition (2023-02-28),

9. 11561149 - Methods for gas leak detection and localization in populated areas having a distance estimate (2023-01-24),

10. 11525819 - Leak detection event aggregation and ranking systems and methods (2022-12-13),

11. 11499868 - Low noise cavity enhanced absorption spectroscopy apparatus and method (2022-11-15),

12. 11092493 - Cavity enhanced absorption spectroscopy using a piecewise tunable laser and hierarchical wavelength determination (2021-08-17),

13. 11035728 - Cavity ring-down spectroscopy having interleaved data acquisition for interference mitigation (2021-06-15),

14. 10962438 - Gas detection systems and methods using measurement position uncertainty representations (2021-03-30),

15. 10962437 - Aggregate leak indicator display systems and methods (2021-03-30),

Company Overview

Picarro, Inc. is a leading innovator in gas leak detection technology, headquartered in Santa Clara, California. The company specializes in advanced solutions that utilize cavity enhanced absorption spectroscopy and multi-channel sampling techniques to accurately identify and quantify gas emissions. Picarro's systems are designed for effective leak detection and spatial concentration variability analysis, making them essential for environmental monitoring and safety applications across various industries.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

79 Patents

#50 in Santa Clara, CA

#1,088 in California

#4,696 in US

#9,588 in the World

Santa Clara, CA, United States of America

Picarro, Inc.

Forward Citations = 836

60 inventors:

Chris W Rella (52 out of 52 patents)

Sze Meng Tan (44 out of 44 patents)

Eric R Crosson (18 out of 23 patents)

4. David Steele (14 out of 14 patents)

5. Bruce A Richman (11 out of 14 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Picarro, Inc.. Retrieved from https://idiyas.com/company/picarro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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