The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Apr. 30, 2019
Picarro, Inc., Santa Clara, CA (US);
Chris W. Rella, Sunnyvale, CA (US);
Hongbing Chen, Sunnyvale, CA (US);
Derek Gregory Fleck, Fremont, CA (US);
John A. Hoffnagle, San Jose, CA (US);
James Ian Lee, San Jose, CA (US);
Gerald Thomas Sorensen, Newark, CA (US);
Sze Meng Tan, Santa Clara, CA (US);
Picarro, Inc., Santa Clara, CA (US);
Abstract
Interleaved data acquisition in optical spectroscopy is used to provide interference correction for time-varying interference. Measurements at a reference frequency are used to provide an estimate of the interference. These reference measurements are interleaved with the remaining measurements in order to provide estimates of the interference vs. time at relevant times. The interference being corrected can be spectrally structured or unstructured.