For the Inventor, By the Inventor

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Dallas, TX, United States of America

Omniprobe, Inc.

USPTO Granted Patents = 30

% Expired Patents = 50.0

EPO Patents = 2

Trademarks = 1

Forward Citations = 347

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12 inventors (with patents filed for the assignee):

Thomas M Moore (25 out of 40 patents)

Gonzalo Amador (9 out of 31 patents)

Lyudmila Zaykova-Feldman (9 out of 10 patents)

4. Rocky Kruger (6 out of 6 patents)

5. Cheryl Hartfield (6 out of 6 patents)

6. Matthew Hammer (4 out of 4 patents)

7. Aaron Smith (3 out of 3 patents)

8. Herschel M Marchman (2 out of 2 patents)

9. Gregory A Magel (1 out of 29 patents)

10. John Mark Anthony (1 out of 2 patents)

11. Brian P Miller (1 out of 1 patent)

12. Lyudmilla Zaykova-Feldman (1 out of 1 patent)

13. Rocky D Kruger (0 patent)

Core Competencies:

Stem Sample Inspection

Energetic-Beam Instruments

Nanomanipulator

Specimen Assemblies

Optical Processing

Automated Stress Testing

TEM Sample Holder

Rapid Sample Preparation

Sample Extraction

Lift-Out Method

Probe Tip Replacement

Strain Detection

30 patents: Sort by Forward Citations

1. RE46350 - Method for stem sample inspection in a charged particle beam instrument (2017-03-27),

2. 9349573 - Total release method for sample extraction in an energetic-beam instrument (2016-05-24),

3. 9097625 - Gas injection system for energetic-beam instruments (2015-08-04),

4. 8759765 - Method for processing samples held by a nanomanipulator (2014-06-24),

5. 8513622 - Method for extracting frozen specimens and manufacture of specimen assemblies (2013-08-20),

6. 8512474 - Apparatus for precursor delivery system for irradiation beam instruments (2013-08-20),

7. 8440969 - Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images (2013-05-14),

8. 8394454 - Method and apparatus for precursor delivery system for irradiation beam instruments (2013-03-12),

9. 8288740 - Method for preparing specimens for atom probe analysis and specimen assemblies made thereby (2012-10-16),

10. 8247768 - Method for stem sample inspection in a charged particle beam instrument (2012-08-21),

11. 8168949 - Method for stem sample inspection in a charged particle beam instrument (2012-05-01),

12. 8054558 - Multiple magnification optical system with single objective lens (2011-11-08),

13. 7961397 - Single-channel optical processing system for energetic-beam microscopes (2011-06-14),

14. 7935937 - Method of forming TEM sample holder (2011-05-03),

15. 7834315 - Method for STEM sample inspection in a charged particle beam instrument (2010-11-16),

Omniprobe, Inc. is a technology company based in Dallas, Texas, specializing in advanced microscopy solutions and analytical instruments. The organization focuses on developing innovative tools that enhance the capabilities of electron microscopy, enabling researchers to achieve high-resolution imaging and analysis of materials at the nanoscale. With a commitment to advancing scientific research, Omniprobe serves a diverse range of industries, including materials science, semiconductor manufacturing, and life sciences.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

Omniprobe, Inc.

30 Patents

#66 in Dallas, TX

#621 in Texas

#11,257 in US

#21,853 in the World

Dallas, TX, United States of America

Omniprobe, Inc.

Forward Citations = 347

12 inventors:

Thomas M Moore (25 out of 40 patents)

Gonzalo Amador (9 out of 31 patents)

Lyudmila Zaykova-Feldman (9 out of 10 patents)

4. Rocky Kruger (6 out of 6 patents)

5. Cheryl Hartfield (6 out of 6 patents)

Please report any incorrect information to [email protected]

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