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Dallas, TX, United States of America

Omniprobe, Inc.

USPTO Granted Patents = 30

EPO Patents = 2

Trademarks = 1

Forward Citations = 346

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13 inventors (with patents filed for the assignee):

Thomas M Moore (25 out of 39 patents)

Gonzalo Amador (9 out of 30 patents)

Lyudmila Zaykova-Feldman (9 out of 10 patents)

4. Rocky Kruger (6 out of 6 patents)

5. Cheryl Hartfield (6 out of 6 patents)

6. Matthew Hammer (4 out of 4 patents)

7. Aaron Smith (3 out of 3 patents)

8. Herschel M Marchman (2 out of 2 patents)

9. Gregory A Magel (1 out of 29 patents)

10. John Mark Anthony (1 out of 2 patents)

11. Brian P Miller (1 out of 1 patent)

12. Lyudmilla Zaykova-Feldman (1 out of 1 patent)

13. Rocky D Kruger (0 patent)

30 patents: Sort by Forward Citations

1. RE46350 - Method for stem sample inspection in a charged particle beam instrument (2017-03-27),

2. 9349573 - Total release method for sample extraction in an energetic-beam instrument (2016-05-24),

3. 9097625 - Gas injection system for energetic-beam instruments (2015-08-04),

4. 8759765 - Method for processing samples held by a nanomanipulator (2014-06-24),

5. 8513622 - Method for extracting frozen specimens and manufacture of specimen assemblies (2013-08-20),

6. 8512474 - Apparatus for precursor delivery system for irradiation beam instruments (2013-08-20),

7. 8440969 - Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images (2013-05-14),

8. 8394454 - Method and apparatus for precursor delivery system for irradiation beam instruments (2013-03-12),

9. 8288740 - Method for preparing specimens for atom probe analysis and specimen assemblies made thereby (2012-10-16),

10. 8247768 - Method for stem sample inspection in a charged particle beam instrument (2012-08-21),

11. 8168949 - Method for stem sample inspection in a charged particle beam instrument (2012-05-01),

12. 8054558 - Multiple magnification optical system with single objective lens (2011-11-08),

13. 7961397 - Single-channel optical processing system for energetic-beam microscopes (2011-06-14),

14. 7935937 - Method of forming TEM sample holder (2011-05-03),

15. 7834315 - Method for STEM sample inspection in a charged particle beam instrument (2010-11-16),

Omniprobe, Inc. is a leading global supplier of nanoprobing solutions for electrical failure analysis and device characterization. With a focus on innovative technology and exceptional customer support, Omniprobe provides advanced probing systems, nanopositioners, and accessories to enable precise electrical measurements on a microscopic scale. Their high-performance solutions are utilized in various industries, including semiconductor, materials science, and life sciences, for applications such as semiconductor device testing, research, and development, and quality control.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

30 Patents

#64 in Dallas, TX

#621 in Texas

#10,857 in US

#21,175 in the World

Dallas, TX, United States of America

Omniprobe, Inc.

Forward Citations = 346

13 inventors:

Thomas M Moore (25 out of 39 patents)

Gonzalo Amador (9 out of 30 patents)

Lyudmila Zaykova-Feldman (9 out of 10 patents)

4. Rocky Kruger (6 out of 6 patents)

5. Cheryl Hartfield (6 out of 6 patents)

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