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USPTO Data Jan 1 1976 - Oct 6 2026
10 Patents
#111 in
#29,839 in
#55,986 in the World
Ohmart/vega Corporation
Forward Citations = 92
13 inventors:
Cincinnati, OH, United States of America
Ohmart/vega Corporation
EPO Patents = 1
Trademarks = 8
Forward Citations = 92
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13 inventors (with patents filed for the assignee):
Neil T Wilkie (7 out of 7 patents)
Michael L Topputo (5 out of 7 patents)
Juergen Motzer (3 out of 26 patents)
4. Juergen Dietmeier (3 out of 10 patents)
5. Bonaventure Cahill (1 out of 6 patents)
6. Douglas A Groh (1 out of 1 patent)
7. Christopher P Lewis (1 out of 1 patent)
8. William C Gable (1 out of 1 patent)
9. Joseph E Stigler (1 out of 1 patent)
10. Michael L Tupputo (1 out of 1 patent)
11. Neil T Wilke (1 out of 1 patent)
12. Kevin L Carmichael (1 out of 1 patent)
13. Paul L Houillion (1 out of 1 patent)
14. Cahill Bonaventure (0 patent)
10 patents:
Company Overview
Ohmart/Vega Corporation specializes in the development and manufacturing of advanced measurement and control solutions, particularly in the fields of radiation-based instrumentation and process control. With a strong focus on industries such as nuclear, food and beverage, and pharmaceuticals, the company provides innovative technologies that enhance operational efficiency and safety. Headquartered in Cincinnati, OH, Ohmart/Vega is committed to delivering high-quality products that meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ohmart/vega Corporation. Retrieved from https://idiyas.com/company/ohmart-vega
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]