This inventor holds 1 USPTO granted patent. Top assignee: Ohmart/vega Corporation. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Kevin L. Carmichael: Innovator in Nuclear Level Sensing Technology
Introduction
Kevin L. Carmichael is a notable inventor based in Fairfield, OH (US). He has made significant contributions to the field of nuclear level sensing technology. His innovative approach has led to the development of a unique patent that enhances measurement accuracy in various applications.
Latest Patents
Carmichael holds a patent for a "Nuclear level sensing gauge using scintillating fiber bundle." This invention utilizes a bundle of scintillating fibers to measure the level of product in a bin. A source of nuclear radiation is positioned adjacent to the bin, while the scintillating fibers are placed opposite the radiation source. As nuclear radiation passes through the bin, it interacts with the fibers, generating scintillating photons. The circuitry detects these photons, which indicate the level of radiation-absorbing product in the bin. This innovative technology provides a reliable method for measuring product levels in challenging environments.
Career Highlights
Kevin L. Carmichael is currently employed at Ohmart/Vega Corporation, where he continues to develop and refine technologies related to nuclear sensing. His work has been instrumental in advancing the capabilities of measurement systems in various industries.
Collaborations
Carmichael collaborates with his coworker, Paul L. Houillion, to further enhance the innovations at Ohmart/Vega Corporation. Their combined expertise contributes to the development of cutting-edge solutions in the field.
Conclusion
Kevin L. Carmichael's contributions to nuclear level sensing technology exemplify the impact of innovative thinking in engineering. His patent and ongoing work at Ohmart/Vega Corporation highlight the importance of advancements in measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile