This inventor holds 1 USPTO granted patent. Top assignee: Ohmart/vega Corporation. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Paul L. Houillion: Innovator in Nuclear Level Sensing Technology
Introduction
Paul L. Houillion is a notable inventor based in Loveland, OH (US). He has made significant contributions to the field of nuclear level sensing technology. His innovative approach has led to the development of a unique patent that enhances measurement accuracy in various applications.
Latest Patents
One of Paul L. Houillion's key patents is titled "Nuclear level sensing gauge using scintillating fiber bundle." This invention involves a nuclear level sensing gauge designed to measure the level of product in a bin. The gauge utilizes a bundle of scintillating fibers and a source of nuclear radiation positioned adjacent to the bin. The scintillating fibers are strategically placed opposite the radiation source, allowing nuclear radiation to pass through the bin and impinge upon the fiber bundle. The circuitry detects scintillating photons generated in the fibers, which indicate the level of radiation-absorbing product in the bin. The number of photons generated is representative of the product level, showcasing the effectiveness of this innovative technology. Paul holds 1 patent for this invention.
Career Highlights
Paul L. Houillion is associated with Ohmart/Vega Corporation, where he has contributed his expertise in developing advanced sensing technologies. His work has been instrumental in enhancing the capabilities of nuclear level sensing systems.
Collaborations
Paul collaborates with Kevin L. Carmichael, leveraging their combined knowledge and skills to drive innovation in their field.
Conclusion
Paul L. Houillion's contributions to nuclear level sensing technology exemplify the impact of innovative thinking in engineering. His patent reflects a significant advancement in measurement techniques, showcasing his dedication to improving industrial applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile