For the Inventor, By the Inventor

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Cheonan-si, Chungcheongnam-do, South Korea

Nts Co., Ltd.

USPTO Granted Patents = 3

Forward Citations = 9

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7 inventors (with patents filed for the assignee):

Woo-Yoel Jeong (2 out of 2 patents)

Tae Young Jang (1 out of 1 patent)

Duk-Soon Choi (1 out of 1 patent)

4. In-Seol Hwang (1 out of 1 patent)

5. Seong-Han Park (1 out of 1 patent)

6. In-Seob Kwon (1 out of 1 patent)

7. Dong-Shin Kim (1 out of 1 patent)

3 patents: Sort by Forward Citations

1. 9910068 - Semiconductor chip test device (2018-03-06),

2. 9664706 - Semiconductor chip testing apparatus for picking up and testing a semiconductor chip (2017-05-30),

3. 8975906 - Probe for inspecting electronic component (2015-03-10),

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USPTO Data Jan 1 1976 - Jan 6 2026

3 Patents

#2 in Cheonan-si, Chungcheongnam-do

#2,652 in South Korea

Cheonan-si, Chungcheongnam-do, South Korea

Nts Co., Ltd.

Forward Citations = 9

7 inventors:

Woo-Yoel Jeong (2 out of 2 patents)

Tae Young Jang (1 out of 1 patent)

Duk-Soon Choi (1 out of 1 patent)

4. In-Seol Hwang (1 out of 1 patent)

5. Seong-Han Park (1 out of 1 patent)

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