Incheon, South Korea

Tae Young Jang

This inventor holds 1 USPTO granted patent. Top assignee: Nts Co., Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tae Young Jang. Retrieved from https://idiyas.com/inventor/tae-young-jang-3hdw78hm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Tae Young Jang: Innovator in Semiconductor Technology

Introduction

Tae Young Jang is a prominent inventor based in Incheon, South Korea. He has made significant contributions to the field of semiconductor technology, showcasing his expertise through innovative designs and solutions. His work is particularly focused on enhancing the efficiency and functionality of semiconductor chip testing.

Latest Patents

Tae Young Jang holds a patent for a semiconductor chip test device. This device includes a guide plate with a seating groove, a substrate for mounting an upper semiconductor chip, and sockets equipped with pogo pins for effective testing. The design aims to improve the reliability and accuracy of semiconductor chip testing processes.

Career Highlights

Throughout his career, Tae Young Jang has been associated with Nts Co., Ltd., where he has played a crucial role in advancing semiconductor testing technologies. His innovative approach has led to the development of solutions that address industry challenges and improve testing methodologies.

Conclusion

Tae Young Jang's contributions to semiconductor technology exemplify his commitment to innovation and excellence. His patent for a semiconductor chip test device highlights his ability to create practical solutions that enhance the testing process in the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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