Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
47 Patents
#29 in Nagano
#1,779 in Japan
#14,827 in the World
Nidec Instruments Corporation
Forward Citations = 1
38 inventors:
Nidec Instruments Corporation
Calculating rank
EPO Patents = 3
Trademarks = 4
Forward Citations = 1
Loading Chart...
Loading Chart...
38 inventors (with patents filed for the assignee):
Shinya Miyazawa (6 out of 22 patents)
Shinji Minamisawa (5 out of 98 patents)
Takehiko Yazawa (5 out of 20 patents)
4. Shinji Hatano (4 out of 19 patents)
5. Munemasa Momose (3 out of 11 patents)
6. Takashi Yamamoto (3 out of 16 patents)
7. Ryo Uchiyama (3 out of 9 patents)
8. Hajime Takagi (3 out of 3 patents)
9. Takeshi Sue (2 out of 66 patents)
10. Akira Mori (2 out of 12 patents)
11. Masao Tsuchihashi (2 out of 23 patents)
12. Tadashi Komiyama (2 out of 16 patents)
13. Junro Takeuchi (2 out of 17 patents)
14. Tsutomu Arai (2 out of 21 patents)
15. Keiji Ohta (2 out of 34 patents)
Core Competencies:
Lens Unit
Card Reader
Actuator
Optical Unit
Pump Device
Robot Controller
Fault Detection
Information Processing
Magnetic Recording
Cooling Device
Wiring Board
Ink Ribbon Cassette
47 patents:
Company Overview
Nidec Instruments Corporation, headquartered in Nagano, Japan, specializes in the development and manufacturing of precision instruments and measurement devices. The company focuses on advanced technologies in various sectors, including automotive, industrial, and consumer electronics. Nidec Instruments is committed to innovation, leveraging its expertise in sensor technology and data processing to deliver high-quality solutions that meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nidec Instruments Corporation. Retrieved from https://idiyas.com/company/nidec-instruments
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]