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USPTO Data Jan 1 1976 - Oct 27 2026
9 Patents
#557 in San Jose, CA
#7,751 in California
#32,627 in US
Nextest Systems Corporation
Forward Citations = 105
16 inventors:
San Jose, CA, United States of America
Nextest Systems Corporation
Calculating rank
% Expired Patents = 44.4
Forward Citations = 105
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16 inventors (with patents filed for the assignee):
Paul Magliocco (4 out of 4 patents)
Ray Wakefield (3 out of 3 patents)
Craig Z Foster (2 out of 2 patents)
4. John M Holmes (2 out of 2 patents)
5. Paul G Trudeau (2 out of 4 patents)
6. James St Jean (1 out of 5 patents)
7. David Reynolds (1 out of 5 patents)
8. Michael Ferland (1 out of 5 patents)
9. Michael A Caradonna (1 out of 8 patents)
10. Steven R Bristow (1 out of 5 patents)
11. Young Cheol Kim (1 out of 1 patent)
12. Richard Mark Greene (1 out of 1 patent)
13. Clifford V Ludwig (1 out of 1 patent)
14. Dan P Bullard (1 out of 1 patent)
15. Eric N Parker (1 out of 1 patent)
9 patents:
Company Overview
Nextest Systems Corporation is a leading provider of advanced testing solutions for the semiconductor industry. With a focus on technology innovation and customer satisfaction, Nextest Systems offers a wide range of testing platforms for digital, analog, and mixed-signal applications. The company's products are known for their accuracy, reliability, and efficiency, helping semiconductor manufacturers achieve high yields and lower costs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nextest Systems Corporation. Retrieved from https://idiyas.com/company/nextest-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]