The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2010

Filed:

May. 19, 2006
Applicants:

Clifford V. Ludwig, Saratoga, CA (US);

Dan P. Bullard, Aloha, OR (US);

Michael R. Ferland, Tualatin, OR (US);

Eric N. Parker, Portland, OR (US);

James W. St. Jean, Meredith, NH (US);

David D. Reynolds, Gilford, NH (US);

Inventors:

Clifford V. Ludwig, Saratoga, CA (US);

Dan P. Bullard, Aloha, OR (US);

Michael R. Ferland, Tualatin, OR (US);

Eric N. Parker, Portland, OR (US);

James W. St. Jean, Meredith, NH (US);

David D. Reynolds, Gilford, NH (US);

Assignee:

Nextest Systems Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01); G11C 29/00 (2006.01); G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for testing multiple smart card devices in parallel and asynchronously are provided. The system includes a smart card module that may be easily inserted in a digital test system. The smart card module includes multiple smart card instrument channels, each one of which testing a separate smart card device independently and asynchronously from the others. The smart card instrument channels employ a novel modulation technique based on palette waveforms that are formed of transitions between two data bits.


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