For the Inventor, By the Inventor

Enter assignee name

Cuyahoga Falls, OH, United States of America

Nanotronics Imaging, Inc.

USPTO Granted Patents = 112

% Expired Patents = 0.89

EPO Patents = 18

Trademarks = 16

Forward Citations = 402

Loading Chart...

Loading Chart...

50 inventors (with patents filed for the assignee):

Matthew C Putman (98 out of 105 patents)

John B Putman (84 out of 95 patents)

Vadim Pinskiy (52 out of 53 patents)

4. Damas Limoge (37 out of 37 patents)

5. Julie A Orlando (22 out of 27 patents)

6. Andrew Sundstrom (21 out of 22 patents)

7. Jonathan David Lee (19 out of 50 patents)

8. Michael Moskie (17 out of 17 patents)

9. Denis Y Sharoukhov (12 out of 12 patents)

10. Scott Pozzi-Loyola (10 out of 10 patents)

11. Dylan Fashbaugh (10 out of 10 patents)

12. Eun-Sol Kim (10 out of 10 patents)

13. James Williams, Iii (10 out of 10 patents)

14. Brandon Scott (9 out of 17 patents)

15. Aswin Raghav Nirmaleswaran (9 out of 9 patents)

Core Competencies:

Artificial Intelligence

Process Control

Defect Detection

Microscopy Techniques

Fluorescence Imaging

Dynamic Monitoring

Super-Resolution Imaging

Additive Manufacturing

Training Data Generation

Assembly Error Correction

Noise Reduction

Gesture Controls

112 patents: Sort by Forward Citations

1. 12657686 - Line defect detection (2026-06-16),

2. 12585839 - Process variability simulator for manufacturing processes (2026-03-24),

3. 12462412 - Deep photometric learning (DPL) systems, apparatus and methods (2025-11-04),

4. 12449792 - Predictive process control for a manufacturing process (2025-10-21),

5. 12447687 - Systems, methods, and media for artificial intelligence process control in additive manufacturing (2025-10-21),

6. 12387317 - Artificial intelligence process control for assembly processes (2025-08-12),

7. 12368223 - Fault protected signal splitter apparatus (2025-07-22),

8. 12346088 - Systems, methods, and media for manufacturing processes (2025-07-01),

9. 12339631 - Dynamic monitoring and securing of factory processes, equipment and automated systems (2025-06-24),

10. 12301990 - Deep learning model for auto-focusing microscope systems (2025-05-13),

11. 12298489 - Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel (2025-05-13),

12. 12243293 - System and method for generating training data sets for specimen defect detection (2025-03-04),

13. 12205360 - Defect detection system (2025-01-21),

14. 12174361 - Method and system for mapping objects on unknown specimens (2024-12-24),

15. 12165353 - Systems, methods, and media for manufacturing processes (2024-12-10),

Company Overview

Nanotronics Imaging, Inc. is a technology company based in Cuyahoga Falls, Ohio, specializing in advanced artificial intelligence imaging solutions. The organization focuses on developing innovative technologies for process control and defect detection, utilizing microscopy techniques and fluorescence imaging to enhance manufacturing processes. Their expertise in dynamic monitoring and super-resolution imaging positions them at the forefront of additive manufacturing, enabling industries to achieve higher precision and efficiency in production.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

112 Patents

#1 in Cuyahoga Falls, OH

#159 in Ohio

#3,427 in US

#7,051 in the World

Cuyahoga Falls, OH, United States of America

Nanotronics Imaging, Inc.

Forward Citations = 402

50 inventors:

Matthew C Putman (98 out of 105 patents)

John B Putman (84 out of 95 patents)

Vadim Pinskiy (52 out of 53 patents)

4. Damas Limoge (37 out of 37 patents)

5. Julie A Orlando (22 out of 27 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nanotronics Imaging, Inc.. Retrieved from https://idiyas.com/company/nanotronics-imaging

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…