For the Inventor, By the Inventor

Enter assignee name

Cuyahoga Falls, OH, United States of America

Nanotronics Imaging, Inc.

USPTO Granted Patents = 110

EPO Patents = 14

Trademarks = 20

Forward Citations = 378

Loading Chart...

Loading Chart...

48 inventors (with patents filed for the assignee):

Matthew C Putman (97 out of 104 patents)

John B Putman (83 out of 94 patents)

Vadim Pinskiy (52 out of 53 patents)

4. Damas Limoge (36 out of 36 patents)

5. Julie A Orlando (22 out of 27 patents)

6. Andrew Sundstrom (21 out of 22 patents)

7. Jonathan David Lee (18 out of 49 patents)

8. Michael Moskie (17 out of 17 patents)

9. Denis Y Sharoukhov (12 out of 12 patents)

10. Scott Pozzi-Loyola (10 out of 10 patents)

11. Dylan Fashbaugh (10 out of 10 patents)

12. Eun-Sol Kim (10 out of 10 patents)

13. James Williams, Iii (10 out of 10 patents)

14. Brandon Scott (9 out of 16 patents)

15. Aswin Raghav Nirmaleswaran (9 out of 9 patents)

Core Competencies:

Deep Photometric Learning

Artificial Intelligence Process Control

Additive Manufacturing

Defect Detection

Fluorescence Microscopy

Dynamic Monitoring

Super-Resolution Imaging

Assembly Error Correction

Predictive Process Control

Microscopic Imaging

Gesture Control

Imitation Learning

110 patents: Sort by Forward Citations

1. 12462412 - Deep photometric learning (DPL) systems, apparatus and methods (2025-11-04),

2. 12449792 - Predictive process control for a manufacturing process (2025-10-21),

3. 12447687 - Systems, methods, and media for artificial intelligence process control in additive manufacturing (2025-10-21),

4. 12387317 - Artificial intelligence process control for assembly processes (2025-08-12),

5. 12368223 - Fault protected signal splitter apparatus (2025-07-22),

6. 12346088 - Systems, methods, and media for manufacturing processes (2025-07-01),

7. 12339631 - Dynamic monitoring and securing of factory processes, equipment and automated systems (2025-06-24),

8. 12301990 - Deep learning model for auto-focusing microscope systems (2025-05-13),

9. 12298489 - Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel (2025-05-13),

10. 12243293 - System and method for generating training data sets for specimen defect detection (2025-03-04),

11. 12205360 - Defect detection system (2025-01-21),

12. 12174361 - Method and system for mapping objects on unknown specimens (2024-12-24),

13. 12165353 - Systems, methods, and media for manufacturing processes (2024-12-10),

14. 12155673 - Dynamic monitoring and securing of factory processes, equipment and automated systems (2024-11-26),

15. 12153668 - Securing industrial production from sophisticated attacks (2024-11-26),

Nanotronics Imaging, Inc. is a leading developer of advanced microscopy and imaging systems. With a focus on nanotechnology, the company utilizes cutting-edge technologies to deliver high-resolution imaging solutions. Their innovative products are designed to enable breakthroughs in various fields, including materials science, life sciences, and semiconductors. Through their advanced microscopy platforms, Nanotronics Imaging aims to revolutionize imaging capabilities and empower scientists, researchers, and engineers worldwide.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 16 2025

110 Patents

#1 in Cuyahoga Falls, OH

#153 in Ohio

#3,347 in US

#6,951 in the World

Cuyahoga Falls, OH, United States of America

Nanotronics Imaging, Inc.

Forward Citations = 378

48 inventors:

Matthew C Putman (97 out of 104 patents)

John B Putman (83 out of 94 patents)

Vadim Pinskiy (52 out of 53 patents)

4. Damas Limoge (36 out of 36 patents)

5. Julie A Orlando (22 out of 27 patents)

Please report any incorrect information to support@idiyas.com

Loading…