Hsinchu, Taiwan

Mustek Systems Inc.

Calculating rank
USPTO Granted Patents = 177

% Expired Patents = 2.3

Forward Citations = 1,336

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118 inventors (with patents filed for the assignee):

goldMedal Jenn-Tsair Tsai (59 out of 63 patents)

silverMedal Bill Chen (10 out of 12 patents)

bronzeMedal Te-Chih Chang (9 out of 13 patents)

4.  John Jianghann Lin (8 out of 18 patents)

5.  Jewel Tsai (5 out of 6 patents)

6.  Hsin-Hung Tu (5 out of 8 patents)

7.  Tian-Quey Lee (5 out of 5 patents)

8.  Will Kao (5 out of 6 patents)

9.  Cheng-Pang Chien (4 out of 5 patents)

10.  Adolf T R Hsu (4 out of 4 patents)

11.  Ching-Chih Fan (4 out of 4 patents)

12.  Sun Chen (4 out of 4 patents)

13.  Wayne Lee (4 out of 4 patents)

14.  Jern-Tsair Tsai (4 out of 4 patents)

15.  Hsien-Che Hung (4 out of 7 patents)


Core Competencies:
Image Scanner
Document Scanning
Optical Module
Image Processing
Automatic Document Feeding
Digital Camera
Multi-Lenses Device
Scanning Quality
Firmware Update
Focus Control
Image Data Correction
Scanning Method

177 patents:

Company Overview
Mustek Systems Inc., headquartered in Hsinchu, Taiwan, specializes in advanced image scanning technology. The company develops a range of products including image scanners and document scanning solutions, focusing on enhancing scanning quality and efficiency. Their expertise extends to optical modules, image processing, and automatic document feeding systems, catering to diverse applications in both consumer and professional markets. Mustek's innovations also encompass digital cameras and multi-lens devices, positioning them as a key player in the imaging technology sector.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

Mustek Systems Inc. USPTO Patent Assignee Logo
177 Patents

#45 in Hsinchu

#152 in Taiwan

#4,712 in the World

Hsinchu, TW
Hsinchu, Taiwan
Forward Citations = 1,336

118 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mustek Systems Inc.. Retrieved from https://idiyas.com/company/mustek-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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