Company Filing History:
Years Active: 2000-2001
Title: Wayne Lee - Innovator in Scanning Technology
Introduction
Wayne Lee is a prominent inventor based in Miao Li, Taiwan. He has made significant contributions to the field of scanning technology, holding a total of 4 patents. His innovative work focuses on improving the efficiency and accuracy of flatbed scanners.
Latest Patents
Wayne Lee's latest patents include an "Apparatus and method of detecting a scanning range when applying assistant frames for flatbed scanners." This invention discloses a method for detecting the scanning range by utilizing fixed marks on the assistant frames to determine their sizes. The required scanning ranges are established based on recognized assistant frames obtained from a pre-scan, which reduces the scanning time interval. Another notable patent is the "Apparatus of alignment for scanner and a method of the same." This invention features an alignment pad positioned in front of the image sensor, with a lens placed between them. The alignment pad includes boundary alignment patterns and resolution analysis patterns to assess the lens's performance. The signals detected by the image sensor are processed to generate collation data, which is displayed on a monitor for analysis.
Career Highlights
Wayne Lee is currently employed at Mustek Systems Inc., where he continues to develop innovative scanning solutions. His work has significantly impacted the efficiency of scanning processes, making them faster and more reliable.
Collaborations
Wayne has collaborated with notable coworkers, including Jenn-Tsair Tsai and Flyinga Liao, contributing to various projects that enhance scanning technology.
Conclusion
Wayne Lee's contributions to scanning technology through his patents and work at Mustek Systems Inc. highlight his role as an influential inventor in the field. His innovative solutions continue to shape the future of scanning technology.