The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2005

Filed:

Aug. 10, 2000
Applicants:

Jenn-tsair Tsai, Hsinchu, TW;

June-num Chen, Hsinchu, TW;

Inventors:

Jenn-Tsair Tsai, Hsinchu, TW;

June-Num Chen, Hsinchu, TW;

Assignee:

Mustek Systems Inc., Taiwan, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41B001/419 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides a method and an apparatus for fast finding the best resolution of an optical scanning device during assembling steps. The present invention improves the graphics of the calibration device. Accompanying with calculation of an adjustment device, the present invention generates a referencing parameters. The parameters represent the resolution of the optical scanning device; and further is able to show the balance of horizontal resolution and the balance of vertical resolution. In this case, technicians can optimize the best position of the lens in order to build an optical scanning with precision and narrow the misalignment during assembly.


Find Patent Forward Citations

Loading…