For the Inventor, By the Inventor

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Farmington Hills, MI, United States of America

Medar, Inc.

USPTO Granted Patents = 31

CIPO Patents = 1

Trademarks = 1

Forward Citations = 746

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21 inventors (with patents filed for the assignee):

John Foster Farrow (10 out of 13 patents)

David A Robinson (5 out of 7 patents)

Mitchell G Van Ochten (3 out of 3 patents)

4. Spencer Daniel Luster (2 out of 7 patents)

5. Matthew P Frazer (2 out of 3 patents)

6. Charles J Drake (2 out of 2 patents)

7. Leonard H Bieman (2 out of 8 patents)

8. Craig Lyle Mahaney (2 out of 2 patents)

9. Keith Alan Flick (1 out of 2 patents)

10. Frank Meyer (1 out of 7 patents)

11. Reno C Boilard (1 out of 1 patent)

12. Chanchal Chatterjee (1 out of 2 patents)

13. Mark A Michniewicz (1 out of 1 patent)

14. Yongxing Wang (1 out of 1 patent)

15. Christopher J Cooper (1 out of 1 patent)

Core Competencies:

Resistance Spot Welding

Calibration Methods

Defect Detection

Control Systems

Color Measurement

Optical Measurement

Signal Stabilization

Machine Vision

Light Intensity Control

Beam Deflection

Software Development

Weld Control

31 patents: Sort by Forward Citations

1. 6342686 - Method for determining a condition of a resistance spotwelding system or a workpiece in the system (2002-01-29),

2. 6225590 - Method for determining a condition of a resistance spotwelding system or a workpiece in the system (2001-05-01),

3. 6016161 - Method and system for automatically calibrating a color-based machine (2000-01-18),

4. 5982479 - Method for calibrating a tilt inspection system and reference disk (1999-11-09),

5. 5969753 - Method and system for detecting errors in a sample image (1999-10-19),

6. 5955855 - Method and system for tuning a drive to its coupled motor to minimize (1999-09-21),

7. 5940296 - Method and system for interactively developing a graphical control-flow (1999-08-17),

8. 5821993 - Method and system for automatically calibrating a color camera in a (1998-10-13),

9. 5815255 - Method and system for measuring deflection angle of a beam of light (1998-09-29),

10. 5793243 - Method of stabilizing an electronic signal integrator (1998-08-11),

11. 5764386 - Method and system for automatically monitoring the colors of an object (1998-06-09),

12. 5757978 - Method and system for detecting localized birefringence defects in a (1998-05-26),

13. 5757176 - Method and system for controlling output current of a large, (1998-05-26),

14. 5753903 - Method and system for controlling light intensity in a machine vision (1998-05-19),

15. 5751450 - Method and system for measuring color difference (1998-05-12),

Company Overview

Medar, Inc. is a technology-driven company based in Farmington Hills, Michigan, specializing in advanced medical devices and innovative healthcare solutions. The organization focuses on developing products that enhance patient care and streamline healthcare processes, leveraging cutting-edge technology to address industry challenges. With a commitment to quality and innovation, Medar plays a significant role in the medical device sector, contributing to improved health outcomes and operational efficiencies in healthcare settings.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

31 Patents

#7 in Farmington Hills, MI

#409 in Michigan

#10,936 in US

#21,284 in the World

Farmington Hills, MI, United States of America

Medar, Inc.

Forward Citations = 746

21 inventors:

John Foster Farrow (10 out of 13 patents)

David A Robinson (5 out of 7 patents)

Mitchell G Van Ochten (3 out of 3 patents)

4. Spencer Daniel Luster (2 out of 7 patents)

5. Matthew P Frazer (2 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Medar, Inc.. Retrieved from https://idiyas.com/company/medar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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