Company Filing History:
Years Active: 1997
Title: Innovations of Chanchal Chatterjee
Introduction
Chanchal Chatterjee is an accomplished inventor based in Lafayette, Indiana. He holds two patents that showcase his expertise in measurement systems and image enhancement technologies. His innovative contributions have made significant impacts in various fields.
Latest Patents
Chatterjee's latest patents include a "Method and system for measuring dimensions of an edge of a part." This invention provides a non-contact, non-destructive measurement method for the edges of parts, such as the cutting edge of tools. The system measures the shape and dimensions of the hone with high accuracy, within 5 microns, and offers both automatic detection and manual selection of measurement areas. His second patent, "Methods and apparatus for enhancing gray scale images," describes an image enhancement system that efficiently processes gray scale images. This system captures an analog scene, digitizes it, and applies an enhancement algorithm to produce a final enhanced image.
Career Highlights
Throughout his career, Chatterjee has worked with notable organizations, including Medar, Inc. and the Purdue Research Foundation. His experience in these companies has allowed him to develop and refine his innovative ideas, contributing to advancements in technology.
Collaborations
Chatterjee has collaborated with Vwani P Roychowdhurry, further enhancing his work and expanding the scope of his inventions.
Conclusion
Chanchal Chatterjee's contributions to measurement systems and image enhancement demonstrate his innovative spirit and technical expertise. His patents reflect a commitment to advancing technology and improving processes in various industries.