The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 1997
Filed:
Sep. 29, 1995
Chanchal Chatterjee, Lafayette, IN (US);
Medar, Inc., Farmington Hills, MI (US);
Abstract
A non-contact, non-destructive measurement method and system for the edge of parts such as the cutting edge or 'hone' of tools wherein the shape and dimensions of the hone are measured with high accuracy (i.e., within 5 microns) and repeatability. Given a tool that is mechanically fixtured under the system and a set of user-defined parameters, the measurement system automatically detects a measurement area for different orientations of the tool. Manual selection of the measurement area is also possible. The system then uses a combination of Moire interferometry and image analysis algorithms to compute the shape and dimension of the hone for both radius and waterfall types.