Yongxing Wang

Title: The Innovative Contributions of Yongxing Wang

Introduction

Yongxing Wang is a notable inventor based in Novi, MI, who has made significant contributions to the field of optical measurement. With a focus on developing methods for measuring deflection angles of light beams, his work has implications in various technological applications.

Latest Patents

Wang holds a patent for a "Method and system for measuring deflection angle of a beam of light." This innovative method involves measuring a two-dimensional deflection angle of a light beam reflected from a disk with unknown tilt components. The process begins by generating reference data related to a known tilt of a reference disk. This data is then processed using electrical signals from a two-dimensional photodetector to derive values associated with the deflection angle and the unknown tilt components. The photodetector utilized is preferably a semiconductor photodiode, which measures the position of radiant energy in a focused spot of light. A signal processor, including a computer system programmed with a specific software algorithm, compensates for interaction between the X and Y axes of the photodiode's active area. This compensation addresses alignment errors and tolerances, enhancing the accuracy of measurements.

Career Highlights

Wang is currently employed at Medar, Inc., where he continues to innovate and develop new technologies. His work at the company reflects his commitment to advancing optical measurement techniques and contributing to the field of engineering.

Collaborations

Wang collaborates with talented individuals such as Mitchell G Van Ochten and Matthew P Frazer, who contribute to his projects and enhance the innovative environment at Medar, Inc.

Conclusion

Yongxing Wang's contributions to optical measurement through his patented methods demonstrate his expertise and dedication to innovation. His work not only advances technology but also sets a foundation for future developments in the field.