Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
7 Patents
#12 in Saline, MI
#1,363 in Michigan
#39,947 in US
Mectron Engineering Company, Inc.
Forward Citations = 175
8 inventors:
Saline, MI, United States of America
Mectron Engineering Company, Inc.
Calculating rank
CIPO Patents = 1
EPO Patents = 2
Trademarks = 1
Forward Citations = 175
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8 inventors (with patents filed for the assignee):
Mark Lee Hanna (3 out of 3 patents)
James L Hanna (3 out of 11 patents)
Lamoyne Durham (1 out of 1 patent)
4. Ian Kent Penhorwood (1 out of 1 patent)
5. Michael A Hall (1 out of 1 patent)
6. Robert J Perez (1 out of 1 patent)
7. Alexander T Vanias (1 out of 1 patent)
8. Andrew Hanna (1 out of 1 patent)
9. James Lee Hanna (0 patent)
10. Jack Durham (0 patent)
7 patents:
Company Overview
Mectron Engineering Company, Inc. is a leading provider of engineering solutions for various industries. With a focus on precision and innovation, Mectron offers a wide range of services including design, fabrication, and machining. Our team of experts is dedicated to delivering high-quality products and services to meet the needs of our clients. Visit our website to learn more about how Mectron can help with your engineering needs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mectron Engineering Company, Inc.. Retrieved from https://idiyas.com/company/mectron-engineering-company
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]