This inventor holds 0 USPTO granted patents, plus 1 CIPO patent.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Title: James Lee Hanna and the Non-Contact Inspection System
Introduction
James Lee Hanna is a U.S.-based inventor associated with the Non-Contact Inspection System, a technology designed to assess the shape and dimensions of workpieces during production. The supplied information lists 0 patents for him.
Latest Patents
The provided patent information describes the Non-Contact Inspection System. It is designed to inspect every part in a production run without physical contact, addressing defects that may go undetected by other quality-assurance processes.
Parts move sequentially along an inclined track and pass through a test section. A length-detection array uses a longitudinal sheet of light to measure each workpiece, while additional light sheets oriented across the workpiece help evaluate its profile. Single-channel photodetectors measure how much each light sheet is blocked. Signal-processing hardware and software analyze these readings to produce length and profile data.
Career Highlights
The supplied career information associates Hanna with James L. Hanna and James Lee Hanna. No further details about his roles or employment history were provided.
Collaborations
The available information does not identify specific collaborators or organizations involved in developing the inspection system.
Conclusion
James Lee Hanna is associated with a non-contact inspection approach that uses light and signal processing to measure workpiece geometry during production.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile