The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Oct. 28, 2021
Mectron Engineering Company, Inc., Saline, MI (US);
Andrew Hanna, Saline, MI (US);
MECTRON ENGINEERING COMPANY, INC., Saline, MI (US);
Abstract
A method for inspecting nominally identical workpieces with manufacturing tolerances involves feeding a workpiece to an inspection device; applying a simultaneous translatory and rotational movement to the workpiece via the inspection device while illuminating the workpiece; repeatedly taking camera images of the workpiece during the simultaneous translatory and rotational movement as the workpiece moves across a camera window, the camera images consisting of pixels; setting workpiece parameters based on size and shape of the workpiece; assembling a composite image from the camera images based on the workpiece parameters; determining numerical brightness scores of the workpiece, comparing the determined numerical brightness scores with known numerical brightness scores; assigning a discrepancy score; setting a discrepancy score threshold; determining that the workpiece passes inspection when the discrepancy score is below the discrepancy score threshold; and that the workpiece fails the inspection when the discrepancy score is above the discrepancy score threshold.