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For the Inventor, By the Inventor

Hsinchu, Taiwan

Materials Analysis Technology Inc.


USPTO Granted Patents = 14

% Expired Patents = 7.1


Trademarks = 16

Forward Citations = 4

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19 inventors (with patents filed for the assignee):

goldMedal Hung-Jen Chen (12 out of 20 patents)

silverMedal Pin Chang (4 out of 33 patents)

bronzeMedal Ying-Chan Hung (2 out of 4 patents)

4.  Chun-Wei Wu (2 out of 2 patents)

5.  Keng-Chieh Chu (2 out of 2 patents)

6.  Yung-Sheng Fang (1 out of 17 patents)

7.  Lin-Ai Tai (1 out of 3 patents)

8.  Yu-Ching Chen (1 out of 2 patents)

9.  Chih-Jung Sun (1 out of 1 patent)

10.  Sajal Biring (1 out of 2 patents)

11.  Chien-Wei Wu (1 out of 5 patents)

12.  Kuang-Tse Ho (1 out of 1 patent)

13.  Tsung-ju Chan (1 out of 1 patent)

14.  Yen-An Tsai (1 out of 1 patent)

15.  Yu-Teh Chung (1 out of 1 patent)


14 patents:

1. 12687576 - Testing device and testing system (2026-07-21),
2. 12361530 - Curve alignment method and curve alignment apparatus (2025-07-15),
3. 12260541 - Soldering quality inspection method and soldering quality inspection apparatus (2025-03-25),
4. 12154775 - Analysis system, auxiliary analysis apparatus and analysis method (2024-11-26),
5. 11959834 - Manufacturing method of sample collection component (2024-04-16),
6. 11955312 - Physical analysis method, sample for physical analysis and preparing method thereof (2024-04-09),
7. 11946945 - Sample analyzing method and sample preparing method (2024-04-02),
8. 11291991 - Sample carrier device and method for operating the same (2022-04-05),
9. 11282669 - Carrier device and carrier kit (2022-03-22),
10. 10416050 - Liquid sample drying apparatus, dried sample test piece and preparation method thereof (2019-09-17),
11. 10379075 - Sample collection device and manufacturing method thereof (2019-08-13),
12. 10309875 - Sample collection component and manufacturing method thereof (2019-06-04),
13. 10267713 - Sample preparation system and preparation method for an electron microscope (2019-04-23),
14. 9558565 - Dimension calculation method for a semiconductor device (2017-01-31),
Company Overview
Materials Analysis Technology Inc. is a specialized firm based in Hsinchu, Taiwan, focusing on advanced materials analysis and characterization technologies. The company develops innovative solutions for various industries, including electronics, semiconductors, and materials science, emphasizing precision and reliability in its analytical processes. With a commitment to research and development, the organization aims to enhance material performance and contribute to technological advancements in its field.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

14 Patents

#206 in Hsinchu

#1,113 in Taiwan

#42,249 in the World

Hsinchu, TW
Hsinchu, Taiwan

Materials Analysis Technology Inc.

Forward Citations = 4

19 inventors:

goldMedal Hung-Jen Chen (12 out of 20 patents)

silverMedal Pin Chang (4 out of 33 patents)

bronzeMedal Ying-Chan Hung (2 out of 4 patents)

4.  Chun-Wei Wu (2 out of 2 patents)

5.  Keng-Chieh Chu (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Materials Analysis Technology Inc.. Retrieved from https://idiyas.com/company/materials-analysis-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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