The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Mar. 08, 2016
Applicant:

Materials Analysis Technology Inc., Hsinchu County, TW;

Inventors:

Pin Chang, Hsinchu, TW;

Ying-Chan Hung, Changhua County, TW;

Hung-Jen Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/02 (2006.01); G01N 23/2204 (2018.01); H01J 37/00 (2006.01); G02B 21/00 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G01N 1/02 (2013.01); G01N 23/2204 (2013.01); G02B 5/208 (2013.01); G02B 21/00 (2013.01); H01J 37/00 (2013.01);
Abstract

A sample collection component including a main body and a removable light shielding component is provided. The main body has a sample storing space which is sealable and allows light to pass through. The removable light shielding component is disposed on the main body and located outside the sample storing space for shielding at least a portion of the light passing through the sample storing space. In addition, a manufacturing method of the sample collection component is also provided.


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