% Expired Patents = 16.7

Trademarks = 1

Forward Citations = 62

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4 inventors (with patents filed for the assignee):

Anthony D A Hansen (5 out of 8 patents)

Grisa Mocnik (2 out of 5 patents)

Jeffrey R Blair (2 out of 13 patents)

4. Anthony Da Hansen (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 10746700 - System and method for particulate matter analysis (2020-08-18),

2. 9804082 - Method for automatic performance diagnosis and calibration of a photometric particle analyzer (2017-10-31),

3. 9018583 - Method for automatic performance diagnosis and calibration of a photometric particle analyzer (2015-04-28),

4. 8531671 - Apparatus and methods for determining the concentration of black carbon particles in a combustion exhaust (2013-09-10),

5. 8411272 - Method and apparatus for the analysis of materials (2013-04-02),

6. 6317639 - Automatic wireless data reporting system and method (2001-11-13),

Company Overview

Magee Scientific Corporation is a leading provider of scientific instruments for measuring aerosol particles in the atmosphere. Their products are used by researchers, government agencies, and environmental monitoring organizations around the world. Magee Scientific's instruments are known for their high accuracy, reliability, and ease of use, making them a trusted choice for measuring air quality and understanding atmospheric processes.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

6 Patents

#83 in Berkeley, CA

#10,565 in California

#44,949 in US

Berkeley, CA, United States of America

Magee Scientific Corporation

Forward Citations = 62

4 inventors:

Anthony D A Hansen (5 out of 8 patents)

Grisa Mocnik (2 out of 5 patents)

Jeffrey R Blair (2 out of 13 patents)

4. Anthony Da Hansen (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Magee Scientific Corporation. Retrieved from https://idiyas.com/company/magee-scientific

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]