The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Mar. 06, 2012
Grisa Mocnik, Ljubljana, SI;
Anthony D. A. Hansen, Berkeley, CA (US);
Jeffrey R. Blair, San Francisco, CA (US);
Grisa Mocnik, Ljubljana, SI;
Anthony D. A. Hansen, Berkeley, CA (US);
Jeffrey R. Blair, San Francisco, CA (US);
Magee Scientific Corporation, Berkeley, CA (US);
Abstract
A method is provided for diagnosing the operation of a photometric particle analyzer. The method may determine when the operation is degraded from normal operating conditions, automatically, and the result displayed locally as well as being transmitted to a remote observer. The present invention may be used by optical photometric particle analyzers, or by analyzers that measure other properties of particles collected on filters.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile