The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Dec. 03, 2010
Applicant:

Anthony D. A. Hansen, Berkeley, CA (US);

Inventor:

Anthony D. A. Hansen, Berkeley, CA (US);

Assignee:

Magee Scientific Corporation, Berkely, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 1/00 (2006.01); G01N 33/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and methods are described for determining particulate concentrations in an exhaust gas. One embodiment provides a method of analyzing particles in a gas using an apparatus including a probe and an analyzer. The method includes obtaining a sample of particle laden gas through the probe; obtaining ambient air through the probe; diluting the sample with the ambient air; and providing the diluted sample to the analyzer. Another embodiment provides an apparatus for analyzing particles in a gas. The apparatus includes a probe adapted to accept a gas or ambient air; a volume to dilute the gas with the ambient air; an analyzer responsive to particles in the gas; and electronics to operate the apparatus. The electronics instructs a user to first provide a sample and then provide ambient air into the volume, and then analyzes substantially all of the sample and ambient air for particles.


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