EPO Patents = 4

Trademarks = 2

Forward Citations = 2

Loading Chart...

8 inventors (with patents filed for the assignee):

Carsten Diem (3 out of 3 patents)

Thomas Reiners (3 out of 3 patents)

Raymund Hammer (2 out of 2 patents)

4. Dieter Sorowka (1 out of 1 patent)

5. Peter Lange (1 out of 2 patents)

6. Konstantin Radewald (1 out of 1 patent)

7. Horst-Guenther Ulrich (1 out of 1 patent)

8. Horst-Günther Ulrich (0 patent)

9. Konstantin Radewaldt (0 patent)

3 patents: Sort by Forward Citations

1. 12644763 - Method and gonioradiometer for the direction-dependent measurement of at least one lighting or radiometric characteristic variable of an optical radiation source installed in an object (2026-06-02),

2. 10265873 - Method and gonioradiometer for the direction-dependent measurement of at least one photometric or radiometric characteristic quantity of an optical radiation source (2019-04-23),

3. 10215622 - Method and gonioradiometer for the direction-dependent measurement of at least one lighting or radiometric characteristic variable of an optical radiation source (2019-02-26),

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

3 Patents

#246 in D-1000 Berlin

#8,434 in Germany

Berlin, Germany

Lmt Lichtmesstechnik Gmbh Berlin

Forward Citations = 2

8 inventors:

Carsten Diem (3 out of 3 patents)

Thomas Reiners (3 out of 3 patents)

Raymund Hammer (2 out of 2 patents)

4. Dieter Sorowka (1 out of 1 patent)

5. Peter Lange (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Lmt Lichtmesstechnik Gmbh Berlin. Retrieved from https://idiyas.com/company/lmt-lichtmesstechnik-berlin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

4 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]