The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Nov. 24, 2021
Lmt Lichtmesstechnik Gmbh Berlin, Berlin, DE;
LMT LICHTMESSTECHNIK GMBH BERLIN, Berlin, DE;
Abstract
The invention relates to a method and to a gonioradiometer for the direction-dependent measurement of at least one lighting or radiometric characteristic variable of an optical radiation source () installed in an object (). The method comprises: arranging the object () on a rotary table () which defines a first coordinate system, wherein the object () is arranged on the rotary table () such that the radiation concentration point of the optical radiation source () is spaced apart from the origin (O) of the first coordinate system; determining the position of the radiation concentration point of the optical radiation source () relative to the origin (O) of the first coordinate system (relative position); performing a gonioradiometric measurement which comprises a rotation of the object () in the first coordinate system, the object () being rotated on the rotary table () about the axis of rotation () of the rotary table (); detecting a measurement variable of the radiation source () in a direction-dependent manner by means of the gonioradiometric measurement; calculating the measurement variable for the plurality of emission directions in a second coordinate system, the radiation concentration point of the optical radiation source () being located in the origin of the coordinate system, based on the direction-dependently detected values of the measurement variable, which have been determined in the first coordinate system, and the relative position, wherein the measurement variable is equal to the characteristic variable to be measured or the characteristic variable to be measured is calculated from the measurement variable.
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