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San Diego, CA, United States of America

Litel Instruments

USPTO Granted Patents = 71

% Expired Patents = 52.1

Forward Citations = 1,149

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14 inventors (with patents filed for the assignee):

Adlai H Smith (70 out of 74 patents)

Robert O Hunter, Jr (56 out of 75 patents)

Bruce B McArthur (32 out of 34 patents)

4. Bruce G MacDonald (6 out of 6 patents)

5. Clark C Guest (3 out of 8 patents)

6. Brian Catanzaro (2 out of 9 patents)

7. Joseph Bendik (2 out of 2 patents)

8. Thomas K Khuu (1 out of 5 patents)

9. Chester A Farris, Iii (1 out of 23 patents)

10. Joseph John Bendik, Jr (1 out of 3 patents)

11. Yuji Yamaguchi (1 out of 1 patent)

12. Jim Wilkinson (1 out of 1 patent)

13. Steven Blair (1 out of 1 patent)

14. James Wilkinson (1 out of 1 patent)

Core Competencies:

Image Registration

Wafer Stage Mapping

In-Situ Interferometry

Dynamic Lens Curvature

Chromatic Response

Overlay Data Encoding

Optical Distortion

Fresnel Zone Plates

Holographic Imaging

Laser Ablation Control

Metrology Instrumentation

High Resolution Imaging

71 patents: Sort by Forward Citations

1. 10222178 - Precision geographic location system and method utilizing an image product (2019-03-05),

2. 9903719 - System and method for advanced navigation (2018-02-27),

3. 9483816 - Method and system for high accuracy and reliability registration of multi modal imagery (2016-11-01),

4. 9074848 - Precision geographic location system and method utilizing an image product (2015-07-07),

5. 8786827 - Method and apparatus for measurement of exit pupil transmittance (2014-07-22),

6. 7871004 - Method and apparatus for self-referenced wafer stage positional error mapping (2011-01-18),

7. 7871002 - Method and apparatus for self-referenced wafer stage positional error mapping (2011-01-18),

8. 7846624 - Systems and methods for determination of focus and telecentricity, amelioration of metrology induced effects and application to determination of precision bossung curves (2010-12-07),

9. 7697138 - Method and apparatus for determination of source polarization matrix (2010-04-13),

10. 7688426 - Method and apparatus for measurement of exit pupil transmittance (2010-03-30),

11. 7671979 - Apparatus and process for determination of dynamic lens field curvature (2010-03-02),

12. 7598006 - Method and apparatus for embedded encoding of overlay data ordering in an in-situ interferometer (2009-10-06),

13. 7544449 - Method and apparatus for measurement of crossfield chromatic response of projection imaging systems (2009-06-09),

14. 7515250 - In-situ interferometer arrangement (2009-04-07),

15. 7442951 - Reticle for use in rapid determination of average intrafield scanning distortion having transmissivity of a complementary alignment attribute being different than the transmissivity of at least one alignment attribute (2008-10-28),

Company Overview

Litel Instruments, based in San Diego, CA, specializes in precision metrology solutions that enhance the accuracy and efficiency of optical systems. The company focuses on advanced technologies such as image registration, wafer stage mapping, and in-situ interferometry, addressing critical challenges in the field. Their expertise extends to dynamic lens curvature and chromatic response, ensuring optimal performance in various applications. Litel Instruments is committed to innovation in optical distortion management and overlay data encoding, contributing significantly to the advancement of metrology technologies.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

71 Patents

#91 in San Diego, CA

#1,214 in California

#5,169 in US

#10,513 in the World

San Diego, CA, United States of America

Litel Instruments

Forward Citations = 1,149

14 inventors:

Adlai H Smith (70 out of 74 patents)

Robert O Hunter, Jr (56 out of 75 patents)

Bruce B McArthur (32 out of 34 patents)

4. Bruce G MacDonald (6 out of 6 patents)

5. Clark C Guest (3 out of 8 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Litel Instruments. Retrieved from https://idiyas.com/company/litel-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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