% Expired Patents = 40.0

Forward Citations = 67

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6 inventors (with patents filed for the assignee):

Satoru Takada (3 out of 15 patents)

Tetsuo Suzuki (3 out of 11 patents)

John E Lawrence (1 out of 6 patents)

4. Satoru Takada (1 out of 1 patent)

5. Hidetoshi Inoue (1 out of 1 patent)

6. Yoshihiro Hara (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 7699997 - Method of reclaiming silicon wafers (2010-04-20),

2. 7452481 - Polishing slurry and method of reclaiming wafers (2008-11-18),

3. 6884634 - Specifying method for Cu contamination processes and detecting method for Cu contamination during reclamation of silicon wafers, and reclamation method of silicon wafers (2005-04-26),

4. 5855735 - Process for recovering substrates (1999-01-05),

5. 5622875 - Method for reclaiming substrate from semiconductor wafers (1997-04-22),

Company Overview

Kobe Precision Inc. is a leading provider of high-quality precision parts and components for various industries including automotive, aerospace, and medical. With over 30 years of experience, we are known for our precision machining capabilities, advanced technology, and strict quality control processes. Our team of skilled engineers and technicians ensure that our products meet the highest standards and exceed customer expectations. Visit our website to learn more about our services and capabilities.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

5 Patents

#91 in Hayward, CA

#12,070 in California

#51,620 in US

Hayward, CA, United States of America

Kobe Precision Inc.

Forward Citations = 67

6 inventors:

Satoru Takada (3 out of 15 patents)

Tetsuo Suzuki (3 out of 11 patents)

John E Lawrence (1 out of 6 patents)

4. Satoru Takada (1 out of 1 patent)

5. Hidetoshi Inoue (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Kobe Precision Inc.. Retrieved from https://idiyas.com/company/kobe-precision

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]