Forward Citations = 1

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4 inventors (with patents filed for the assignee):

Lutz Aschke (1 out of 4 patents)

Larissa Juschkin (1 out of 2 patents)

Rainer Lebert (1 out of 5 patents)

4. Ulf Heim (1 out of 2 patents)

1 patent: Sort by Forward Citations

1. 6856395 - Reflectometer arrangement and method for determining the reflectance of selected measurement locations of measurement objects reflecting in a spectrally dependent manner (2005-02-15),

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USPTO Data Jan 1 1976 - Oct 20 2026

1 Patents

#122 in Jena

#15,376 in Germany

Jena, Germany

Jenoptik Mikrotechnik Gmbh

Forward Citations = 1

4 inventors:

Lutz Aschke (1 out of 4 patents)

Larissa Juschkin (1 out of 2 patents)

Rainer Lebert (1 out of 5 patents)

4. Ulf Heim (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Jenoptik Mikrotechnik Gmbh. Retrieved from https://idiyas.com/company/jenoptik-mikrotechnik

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]