Ilmenau, Germany

Ulf Heim


Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1998-2005

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2 patents (USPTO):Explore Patents

Title: Ulf Heim: Innovator in Reflectometry

Introduction

Ulf Heim is a notable inventor based in Ilmenau, Germany. He has made significant contributions to the field of reflectometry, particularly through his innovative patents. With a total of 2 patents, Heim's work focuses on enhancing measurement techniques for objects that reflect light in a spectrally dependent manner.

Latest Patents

One of Ulf Heim's latest patents is a reflectometer arrangement and method for determining the reflectance of selected measurement locations on measurement objects. This invention aims to reduce the time required for measuring a measurement object by utilizing a robust and simple measurement structure. The design allows for the use of compact radiation sources with lower output compared to synchrotron sources, making it suitable for production environments. The method involves directing a measurement beam from a polychromatically emitting radiation source onto the measurement location, while detecting the reflected radiation integrally. This arrangement is particularly useful for surfaces that reflect in a spectrally dependent manner, especially in the extreme ultraviolet range.

Another significant patent by Heim is a device for the deflection of light beams. This invention further showcases his expertise in optical measurement technologies.

Career Highlights

Throughout his career, Ulf Heim has worked with several companies, including Aixuv GmbH and Jenoptik Mikrotechnik GmbH. His experience in these organizations has contributed to his development as an inventor and innovator in the field of reflectometry.

Collaborations

Ulf Heim has collaborated with notable colleagues such as Rainer Lebert and Lutz Aschke. These partnerships have likely enriched his work and led to advancements in his inventions.

Conclusion

Ulf Heim's contributions to reflectometry through his patents demonstrate his commitment to innovation in measurement technologies. His work continues to influence the field and pave the way for future advancements.

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