Forward Citations = 353

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5 inventors (with patents filed for the assignee):

Anthony Jenkins (5 out of 15 patents)

William Joseph McGann (2 out of 14 patents)

Anthony Jenkins (1 out of 1 patent)

4. Peter W Stephens (1 out of 1 patent)

5. Kenneth Ribeiro (1 out of 1 patent)

7 patents: Sort by Forward Citations

1. 5491337 - Ion trap mobility spectrometer and method of operation for enhanced (1996-02-13),

2. 5263075 - High angular resolution x-ray collimator (1993-11-16),

3. 5200614 - Ion mobility spectrometers (1993-04-06),

4. 5027643 - Method and apparatus for detecting low volatility atmospheric vapors (1991-07-02),

5. 5007072 - X-ray diffraction inspection system (1991-04-09),

6. 4964309 - Portal vapor detection system (1990-10-23),

7. 4947352 - Temperature compensation in differential pressure leak detection (1990-08-07),

Company Overview

Ion Track Instruments is a leading provider of cutting-edge detection solutions for security and defense applications. With a commitment to innovation, quality, and reliability, Ion Track Instruments offers a range of advanced technologies for detecting explosives, narcotics, and other threats in various environments. Their products are used by law enforcement agencies, military forces, and security professionals around the world to keep communities safe and secure.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

7 Patents

#58 in Burlington, MA

#2,306 in Massachusetts

#39,929 in US

Burlington, MA, United States of America

Ion Track Instruments

Forward Citations = 353

5 inventors:

Anthony Jenkins (5 out of 15 patents)

William Joseph McGann (2 out of 14 patents)

Anthony Jenkins (1 out of 1 patent)

4. Peter W Stephens (1 out of 1 patent)

5. Kenneth Ribeiro (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ion Track Instruments. Retrieved from https://idiyas.com/company/ion-track-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]