The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 1990
Filed:
Mar. 25, 1988
Anthony Jenkins, Fowlmere, GB;
Ion Track Instruments, Inc., Burlington, MA (US);
Abstract
A microprocessor is employed to control a test program which operates to cause a component under test to be filled (or evacuated) to a predetermined pressure P.sub.2 at which a leak test is to be carried out. The test program is arranged firstly to perform a rapid test at atmospheric pressure P.sub.1 to determine the pressure change dpl'/dt in the component due to the temperature fluctuation. The component is then filled (or evacuated) automatically to the test pressure P.sub.T, at which the leak check is carried out. Temperature compensation is achieved by subtracting the value of C dpl'/dt from the pressure change dp.sub.t /dt actually measured, i.e. the actual leak rate dPL/dt is given by ##EQU1## where the constant, C, is generated from an identical proram run, the calibration run, on a known non-leaker with a high temperature fluctuation.