Stony Brook, NY, United States of America

Peter W Stephens

USPTO Granted Patents = 1 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 90(Granted Patents)


Company Filing History:


Years Active: 1991

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Peter W. Stephens: A Pioneer in X-ray Diffraction Inspection Systems

Introduction

Peter W. Stephens, an inventor based in Stony Brook, NY, has made significant contributions to the field of inspection systems. With a focus on detecting specific crystalline materials, he holds a patent for an innovative X-ray diffraction inspection system. His work plays a crucial role in enhancing safety and security measures in various industries, particularly for detecting explosives and illegal drugs.

Latest Patents

Peter's notable patent revolves around an advanced X-ray diffraction inspection system. This system employs an X-ray source coupled with a collimated array of detectors designed to sense radiation scattered by inspected objects. A sophisticated signal processing mechanism compares the collected data with selected spectra, enabling accurate determination of the presence of targeted materials within the object being examined.

Career Highlights

Currently, Peter is associated with Ion Track Instruments, where he leverages his innovative capabilities to develop cutting-edge technologies. His role involves not only the design and implementation of advanced inspection systems but also collaborating on research projects that push the boundaries of existing technology.

Collaborations

Peter's work does not happen in isolation. He collaborates closely with his coworker, Anthony Jenkins, focusing on refining the inspection technology and enhancing its applicability across various sectors. Their combined expertise has contributed significantly to the advancement of reliable detection systems, ensuring both efficacy and safety.

Conclusion

Peter W. Stephens exemplifies the spirit of innovation in the realm of detection technologies. His patented X-ray diffraction inspection system showcases the importance of combining scientific understanding with practical applications. As he continues to work at Ion Track Instruments, Peter plays a vital role in shaping the future of inspection systems and their capabilities in safeguarding communities.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…