Newark, CA, United States of America

Invision Technologies, Inc.


USPTO Granted Patents = 18

% Expired Patents = 27.8

Trademarks = 1

Forward Citations = 1,216

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17 inventors (with patents filed for the assignee):

goldMedal David E Kresse (12 out of 24 patents)

silverMedal William H Baylis (6 out of 8 patents)

bronzeMedal Gerhard Fenkart (5 out of 6 patents)

4.  Andrew J Banchieri (3 out of 4 patents)

5.  Francois Mesqui (3 out of 3 patents)

6.  Walter I Garms (2 out of 3 patents)

7.  François A Mesqui (2 out of 2 patents)

8.  François A Mesqui (2 out of 2 patents)

9.  Kristian R Peschmann (2 out of 8 patents)

10.  Bradley T Sykes (1 out of 4 patents)

11.  Sondre Skatter (1 out of 12 patents)

12.  Ugo Di Girolamo (1 out of 4 patents)

13.  Pierfrancesco Landolfi (1 out of 7 patents)

14.  François R Gaultier (1 out of 1 patent)

15.  Gerhard Renkart (1 out of 1 patent)


18 patents:

Company Overview
Invision Technologies, Inc. is a technology company based in Newark, California, specializing in advanced detection and imaging systems. The organization focuses on developing innovative solutions for security applications, particularly in the fields of aviation and transportation. By leveraging cutting-edge technologies, Invision aims to enhance safety and efficiency in critical environments. Their expertise encompasses a range of engineering disciplines, contributing to the advancement of detection methodologies and systems integration.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

18 Patents

#23 in Newark, CA

#4,284 in California

#17,952 in US

#34,187 in the World

Newark, CA (US)
Newark, CA, United States of America
Forward Citations = 1,216

17 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Invision Technologies, Inc.. Retrieved from https://idiyas.com/company/invision-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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