Zurich, Switzerland

Gerhard Renkart

This inventor holds 1 USPTO granted patent. Top assignee: Invision Technologies, Inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gerhard Renkart. Retrieved from https://idiyas.com/inventor/gerhard-renkart

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 47(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Gerhard Renkart: Innovator in Nonintrusive Inspection Technology

Introduction

Gerhard Renkart is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of nonintrusive inspection technology, particularly through his innovative patent.

Latest Patents

Renkart holds a patent for a nonintrusive inspection apparatus that utilizes an x-ray technique. This advanced apparatus is capable of inspecting up to 600 containers per hour. It is designed to be compact and easily maintainable. Key features of the apparatus include radiation locking with active curtains, continuous scanning through an x-ray line scanner subsystem and a CT scanner subsystem, and excellent structural integrity. The design ensures radiation containment in a self-shielding manner, along with a maintainable driving arrangement. Additionally, it incorporates shielding curtains that can be quickly raised and lowered, a container jam release mechanism, and efficient air conditioning.

Career Highlights

Gerhard Renkart has been instrumental in the development of innovative technologies at Invision Technologies, Inc. His work has significantly advanced the capabilities of nonintrusive inspection systems.

Collaborations

Renkart has collaborated with notable colleagues, including François A Mesqui and David E Kresse, contributing to the advancement of inspection technologies.

Conclusion

Gerhard Renkart's contributions to nonintrusive inspection technology exemplify his innovative spirit and dedication to improving safety and efficiency in container inspection. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to technological progress.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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